Structure model for the τ(μ) phase in Al–Cr–Si alloys deduced from the λ phase by the strong-reflections approach

Zhang, H.; He, Z.B.; Oleynikov, P.; Zou, X.D.; Hovmöller, S.; Kuo, K.H.

doi:10.1107/S0108768105035779

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 7
Experimental electron diffraction patterns of τ(μ) taken along the (a) [001], (c) [010] and (e) [211] zone axes on a Philips CM12 transmission electron microscope at 100 kV are compared with those simulated from the structure model using the program MacTempas, shown in (b), (d) and (f), respectively. The specimen thicknesses used in the simulations were 100, 50 and 50 Å for (b), (d) and (f).

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 62| Part 1| January 2006| Pages 16-25

doi:10.1107/S0108768105035779

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