Structure of Ce2RhIn8: an example of complementary use of high-resolution neutron powder diffraction and reciprocal-space mapping to study complex materials

Moshopoulou, E.G.; Ibberson, R.M.; Sarrao, J.L.; Thompson, J.D.; Fisk, Z.

doi:10.1107/S0108768106003314

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 4
(a) Reciprocal-space map and (b) the corresponding peak profile of the 002 reflection at 8.2 K. The horizontal axis of (a) is the direction of the ω–2θ scan (direction of the diffraction vector) and the vertical axis of (a) is the offset in the ω-scan direction [∊ = (2θ/2) − ω]. The map was taken at the non-bisecting setting, i.e. ω ≠ θ. The color scale is logarithmic to base 10.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 62| Part 2| March 2006| Pages 173-189

doi:10.1107/S0108768106003314

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