Crystal structures of the trifluoromethyl sulfonates M(SO3CF3)2 (M = Mg, Ca, Ba, Zn, Cu) from synchrotron X-ray powder diffraction data

Dinnebier, R.; Sofina, N.; Hildebrandt, L.; Jansen, M.

doi:10.1107/S0108768106009517

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 1
Scattered X-ray intensities for Ca(SO₃CF₃)₂ at T = 295 K as a function of diffraction angle 2θ. Shown are the observed patterns (diamonds), the best Rietveld-fit profiles (line) and the difference curve between observed and calculated profiles (below). The high-angle part starting at 17° 2θ is enlarged. The diffraction patterns and Rietveld-fit profiles for Mg-, Ba-, Zn- and Cu-trifluoromethyl sulfonate are given in the supplementary material.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 62| Part 3| May 2006| Pages 467-473

doi:10.1107/S0108768106009517

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