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Figure 5
Rietveld refinement of the synchrotron (upper panel) and neutron (lower panel) diffraction patterns of fully hydrogenated and deuterated 4-methylpyridine-N-oxide at 25 and 10 K, respectively. Experimental data: open circles; calculated: continuous line; allowed Bragg reflections: vertical marks. The difference between the observed and calculated profiles is displayed at the bottom. The inset of the upper panel shows an enlargement of the synchrotron data refinement at high angles.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 62| Part 4| July 2006| Pages 627-633
doi:10.1107/S0108768106011608
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