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Figure 1
(a) Projection on the crystallographic ab plane of the basic melilite structure (four unit cells are shown); (b) high-voltage, high-resolution transmission electron micrograph of a thin specimen area of a Co-melilite crystal with the Fourier power spectrum inset; (c) magnified region squared with the dotted line in Fig. 1[link](b); (d) multi-slice image simulation with a defocus value of Δf = 80 nm and the specimen thickness t = 3.5 nm.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 62| Part 4| July 2006| Pages 547-555
doi:10.1107/S0108768106016612
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