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Figure 6
Scattered X-ray intensity for MgCl2·2H2O at T = 369 K as a function of diffraction angle 2θ. Shown are the observed pattern (diamonds), the best Rietveld-fit profile in °2θ (a), the difference curve between observed and calculated profile (b), and the reflection markers (vertical bars). The wavelength was λ = 0.92187 Å. The R values are Rp = 0.0010, Rwp = 0.017, and RF2 = 0.072.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 63| Part 2| March 2007| Pages 235-242
doi:10.1107/S0108768107002558
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