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Figure 6
Synchrotron diffraction pattern [λ = 0.69838 (1) Å] for the degraded material. The solid drawn line is calculated based on the structure parameters of Cs2EuBr5·10H2O. The difference curve can be considered as a fingerprint of at least one more as yet unidentified phase in the sample.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 63| Part 2| March 2007| Pages 201-204
doi:10.1107/S0108768106049032
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