view article
Figure 2
Synchrotron X-ray diffraction pattern for sample C2 obtained using the powder diffractometer at SLS/PSI in Switzerland using 0.8236 Å X-rays. For details see the caption to Fig. 1[link] and §§3.2[link] and 3.3[link].

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 63| Part 6| November 2007| Pages 850-861
doi:10.1107/S0108768107035136
Follow Acta Cryst. B
Sign up for e-alerts
E-alerts
Follow Acta Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS