X-ray diffraction: a powerful tool to probe and understand the structure of nanocrystalline calcium silicate hydrates

Grangeon, S.; Claret, F.; Linard, Y.; Chiaberge, C.

doi:10.1107/S2052519213021155

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 5
Theoretical intensity and position from the basal reflection of a sample built up of 11 Å tobermorite having a mean number of n = 10 (solid line), 6 (dashed line), 4 (dashed-dotted line) and 2.5 (long-dashed line) stacked layers. Distribution is log-normal.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 69| Part 5| September 2013| Pages 465-473

doi:10.1107/S2052519213021155

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