XPAD X-ray hybrid pixel detector for charge density quality diffracted intensities on laboratory equipment

Wenger, E.; Dahaoui, S.; Alle, P.; Parois, P.; Palin, C.; Lecomte, C.; Schaniel, D.

doi:10.1107/S2052520614017338

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 5
Normal probability plot after multipole refinement. Experimental weighted residuals. $[ e = (\left|{F}_{\rm o}\right|-\left|{F}_{\rm c}\right|)/\sigma (\left|{F}_{\rm o}\right|)]$ versus normal distribution [I > 3σ(I) cut-off].

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 70| Part 5| September 2014| Pages 783-791

doi:10.1107/S2052520614017338

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