XPAD X-ray hybrid pixel detector for charge density quality diffracted intensities on laboratory equipment

Wenger, E.; Dahaoui, S.; Alle, P.; Parois, P.; Palin, C.; Lecomte, C.; Schaniel, D.

doi:10.1107/S2052520614017338

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 8
Deformation electron density after spherical atoms refinement in the C3—Fe—N4 plane. Map calculated for: sin θ/λ < 0.9 Å⁻¹ and I > 3σ(I). Contour: 0.1 e Å⁻³.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 70| Part 5| September 2014| Pages 783-791

doi:10.1107/S2052520614017338

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