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Figure 8
Laue diffraction pattern of Cr7Ni at 200 K. The node points represent Miller indices for high-order reflections occurring at the same 2θ for multiple wavelengths. The dark shadows are scattered from the textured Al in the cryostat.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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