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Figure 1
Rietveld refinement diagram based on synchrotron X-ray diffraction data of m-CPPD. Experimental synchrotron X-ray diffraction data are shown in red, simulated diagram in black and the difference between the two diagrams in blue; vertical green lines indicate the Bragg peak positions.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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