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Figure 1
X-ray derived SF% patterns reflecting electron delocalization effects in benzene crystal. The top row shows SF% from bonded atoms at b.c.p. and above/below molecular plane. The second row shows the SF% from the other atoms in the same reference points (reproduced with permission from Gatti et al., 2016BB5).

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 72| Part 2| April 2016| Pages 169-170
doi:10.1107/S2052520616004674
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