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Figure 1
Map of temperature-dependent X-ray diffractograms (XRD) for the In2S3 powder. Each diffractogram is measured at a specific temperature which corresponds to one column in the graph with the y-direction displaying the 2θ diffraction angle. The position of the column in the x-direction corresponds to the temperature at which the diffractogram was recorded, while the colour indicates the XRD intensity in logarhythmic scale (dark blue = low intensity, red = high intensity). Three structural modifications of In2S3 in different temperature regimes can be distinguished according to appearing/disappearing diffraction peaks as indicated in the figure. The wavelength of the incident X-ray photons is 0.14276 Å.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 72| Part 3| June 2016| Pages 410-415
doi:10.1107/S2052520616007058
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