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Figure 4
Observed (Yo, dots), calculated (Yc, line), difference (Yo − Yc, below) and background (Yb, smooth line) intensities as obtained after Rietveld refinement using synchrotron data. All intensities are multiplied by 6 for 2θ ≥ 20° to show details. Ticks give reflection positions, from top to bottom, for birnessite, Na2Mn3O7 and (Na,□)5[MnO2]13. The inset shows the fit in the low-angle region which is important for Na site occupation factors (see text). λ = 0.415352 Å.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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