Sampling of reflections for integration. The data sets of series th02c with rotation widths from 0.02 to 0.64° were integrated with a varying number of grid points used to represent reflection profiles in XDS. I/σ(I) and Rmerge of the highest resolution shell from a data set with the specified Δφ are plotted against the number of grid points used in XDS. Scaling statistics for the widest-sliced data set do not improve when more than nine grid points, which is the default value of XDS, are used. The statistics for fine-sliced data sets improve when using up to 21 grid points, which is the maximum value possible in XDS.