supplementary materials


kj2091 scheme

Acta Cryst. (2008). E64, o1783    [ doi:10.1107/S160053680802374X ]

Tri-p-tolylphosphine

H. Wang, Y.-B. Wang, B.-N. Liu, S.-G. Tang and P. Wei

Abstract top

In the title compound C21H21P, the P atom is situated on a crystallographic threefold rotatory-inversion axis, resulting in threefold rotation symmetry of the title compound. The dihedral angles between the symmetry-related benzene rings are 87.40 (18)°.

Comment top

Some organophosphorus derivatives are important chemical materials, which are primarily used as intermediates of organic phosphorus flame retardants and phosphorus ligands in biphasic water soluble catalysts. The P atom is situated on a crystallographic threefold rotatory-inversion axis, resulting in threefold rotation symmetry of the title compound.

The dihedral angles between the symmetry-related benzene rings are 87.40 (18)°.

Related literature top

For related literature, see: Brown et al. (1988).

Experimental top

20 g Sodium (0.870 mol) was added to 125 ml toluene, then the mixture was heated up to 383 K and stirred to form fine particles of sodium, which subsequently melted. Then the temperature was lowered to 323 K. P-chlorotoluene (55.2 g / 0.436 mol) and phosphorus trichloride (19.8 g / 0.144 mol) were added, keeping the temperature between 323 K and 333 K for two hours. The product was concentrated in a vacuum to gain a white solid (35.0 g, 80%) (Brown et al., 1988). The pure title compound was obtained by crystallizing from methanol. Crystals suitable for X-ray diffraction were obtained by slow evaporation of an methanol solution.

Refinement top

All H atoms bonded to the C atoms were placed geometrically at the distances of 0.93–0.97 Å, and included in the refinement in riding motion approximation with Uiso(H) = 1.2 or 1.5 Ueq of the carrier atom.

Computing details top

Data collection: CAD-4 Software (Enraf–Nonius, 1989); cell refinement: CAD-4 Software (Enraf–Nonius, 1989); data reduction: XCAD4 (Harms & Wocadlo, 1995); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008); molecular graphics: SHELXTL (Sheldrick, 2008); software used to prepare material for publication: SHELXL97 (Sheldrick, 2008).

Figures top
[Figure 1] Fig. 1. The molecular structure of the title compound, showing the atom-numbering scheme and displacement ellipsoids at the 30% probability level. Symmetry codes: (i) 1 - x + y,1 - x,z (ii) 1 - y + 1,x-y,z
(I) top
Crystal data top
C21H21PZ = 6
Mr = 304.35F000 = 972
Trigonal, R3Dx = 1.110 Mg m3
Hall symbol: -R 3Mo Kα radiation
λ = 0.71073 Å
a = 12.6562 (18) ÅCell parameters from 25 reflections
b = 12.6562 (18) Åθ = 10–13º
c = 19.696 (4) ŵ = 0.15 mm1
α = 90ºT = 293 (2) K
β = 90ºBlock, colourless
γ = 120º0.40 × 0.30 × 0.20 mm
V = 2732.2 (8) Å3
Data collection top
Enraf–Nonius CAD-4
diffractometer
Rint = 0.050
Radiation source: fine-focus sealed tubeθmax = 25.2º
Monochromator: graphiteθmin = 2.1º
T = 293(2) Kh = 15→7
ω/2θ scansk = 0→15
Absorption correction: ψ scan
(North et al., 1968)
l = 0→23
Tmin = 0.958, Tmax = 0.9713 standard reflections
3464 measured reflections every 200 reflections
1095 independent reflections intensity decay: none
790 reflections with I > 2σ(I)
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.063H-atom parameters constrained
wR(F2) = 0.171  w = 1/[σ2(Fo2) + (0.05P)2 + 4P]
where P = (Fo2 + 2Fc2)/3
S = 1.03(Δ/σ)max < 0.001
1095 reflectionsΔρmax = 0.26 e Å3
67 parametersΔρmin = 0.34 e Å3
Primary atom site location: structure-invariant direct methodsExtinction correction: none
Crystal data top
C21H21Pγ = 120º
Mr = 304.35V = 2732.2 (8) Å3
Trigonal, R3Z = 6
a = 12.6562 (18) ÅMo Kα
b = 12.6562 (18) ŵ = 0.15 mm1
c = 19.696 (4) ÅT = 293 (2) K
α = 90º0.40 × 0.30 × 0.20 mm
β = 90º
Data collection top
Enraf–Nonius CAD-4
diffractometer
790 reflections with I > 2σ(I)
Absorption correction: ψ scan
(North et al., 1968)
Rint = 0.050
Tmin = 0.958, Tmax = 0.9713 standard reflections
3464 measured reflections every 200 reflections
1095 independent reflections intensity decay: none
Refinement top
R[F2 > 2σ(F2)] = 0.06367 parameters
wR(F2) = 0.171H-atom parameters constrained
S = 1.03Δρmax = 0.26 e Å3
1095 reflectionsΔρmin = 0.34 e Å3
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
P0.66670.33330.01046 (7)0.0705 (5)
C10.8153 (4)0.8316 (3)0.1198 (2)0.0992 (12)
H1A0.77760.86860.09440.149*
H1B0.78820.82090.16610.149*
H1C0.90240.88320.11820.149*
C20.7805 (3)0.7091 (3)0.08924 (18)0.0710 (8)
C30.8232 (3)0.6365 (3)0.11520 (14)0.0647 (8)
H3A0.87520.66360.15250.078*
C40.7903 (3)0.5238 (3)0.08689 (15)0.0644 (7)
H4A0.82050.47680.10580.077*
C50.7147 (3)0.4803 (2)0.03192 (14)0.0609 (7)
C60.6732 (3)0.5549 (3)0.0040 (2)0.0811 (10)
H6A0.62470.53010.03480.097*
C70.7050 (3)0.6663 (3)0.03445 (19)0.0809 (10)
H7A0.67350.71300.01670.097*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
P0.0791 (6)0.0791 (6)0.0533 (8)0.0396 (3)0.0000.000
C10.096 (3)0.076 (2)0.128 (4)0.044 (2)0.000 (2)0.008 (2)
C20.0533 (16)0.0599 (17)0.097 (2)0.0259 (14)0.0093 (15)0.0109 (16)
C30.0609 (16)0.0699 (18)0.0587 (17)0.0294 (14)0.0003 (13)0.0060 (13)
C40.0648 (17)0.0653 (17)0.0666 (18)0.0353 (14)0.0009 (14)0.0129 (14)
C50.0607 (16)0.0677 (17)0.0530 (16)0.0312 (13)0.0028 (12)0.0109 (13)
C60.069 (2)0.083 (2)0.091 (2)0.0377 (17)0.0151 (17)0.0131 (18)
C70.074 (2)0.076 (2)0.100 (3)0.0436 (17)0.0036 (18)0.0164 (18)
Geometric parameters (Å, °) top
P—C5i1.843 (3)C3—C41.388 (4)
P—C5ii1.843 (3)C3—H3A0.9300
P—C51.843 (3)C4—C51.366 (4)
C1—C21.508 (4)C4—H4A0.9300
C1—H1A0.9600C5—C61.401 (4)
C1—H1B0.9600C6—C71.394 (5)
C1—H1C0.9600C6—H6A0.9300
C2—C71.361 (5)C7—H7A0.9300
C2—C31.377 (4)
C5i—P—C5ii101.08 (11)C4—C3—H3A119.3
C5i—P—C5101.08 (11)C5—C4—C3121.5 (3)
C5ii—P—C5101.08 (11)C5—C4—H4A119.3
C2—C1—H1A109.5C3—C4—H4A119.3
C2—C1—H1B109.5C4—C5—C6117.6 (3)
H1A—C1—H1B109.5C4—C5—P125.2 (2)
C2—C1—H1C109.5C6—C5—P117.1 (2)
H1A—C1—H1C109.5C7—C6—C5119.8 (3)
H1B—C1—H1C109.5C7—C6—H6A120.1
C7—C2—C3117.4 (3)C5—C6—H6A120.1
C7—C2—C1120.8 (3)C2—C7—C6122.3 (3)
C3—C2—C1121.8 (3)C2—C7—H7A118.8
C2—C3—C4121.4 (3)C6—C7—H7A118.8
C2—C3—H3A119.3
C7—C2—C3—C40.3 (5)C5i—P—C5—C6169.0 (2)
C1—C2—C3—C4179.8 (3)C5ii—P—C5—C687.2 (3)
C2—C3—C4—C50.3 (5)C4—C5—C6—C73.0 (5)
C3—C4—C5—C61.4 (5)P—C5—C6—C7179.0 (3)
C3—C4—C5—P179.2 (2)C3—C2—C7—C61.5 (5)
C5i—P—C5—C48.8 (3)C1—C2—C7—C6178.4 (3)
C5ii—P—C5—C495.0 (2)C5—C6—C7—C23.2 (5)
Symmetry codes: (i) −x+y+1, −x+1, z; (ii) −y+1, xy, z.
Acknowledgements top

The authors thank the Center of Testing and Analysis, Nanjing University, for support.

references
References top

Brown, S. J., Clark, J. H. & Macquarrie, D. J. (1988). J. Chem. Soc. Dalton Trans. pp. 277–80.

Enraf–Nonius (1989). CAD-4 Software. Enraf–Nonius, Delft, The Netherlands.

Harms, K. & Wocadlo, S. (1995). XCAD4. University of Marburg, Germany.

North, A. C. T., Phillips, D. C. & Mathews, F. S. (1968). Acta Cryst. A24, 351–359.

Sheldrick, G. M. (2008). Acta Cryst. A64, 112–122.