supplementary materials


at2775 scheme

Acta Cryst. (2009). E65, o1250    [ doi:10.1107/S1600536809016614 ]

5-(2-Fluoro-4-nitrophenyl)-1,3,4-thiadiazole-2-amine

Y. Wang, R. Wan, F. Han and P. Wang

Abstract top

The title compound, C8H5FN4O2S, was synthesized by the reaction of 2-fluoro-4-nitrobenzoic acid and thiosemicarbazide. The dihedral angle between the thiadiazole and benzene rings is 27.1 (2)°. In the crystal, intermolecular N-H...N and C-H...O hydrogen bonds link the molecules.

Comment top

1,3,4-Thiadiazole derivatives represent an interesting class of compounds possessing broad spectrum biological activities (Nakagawa et al., 1996). These compounds are known to exhibit diverse biological effects, such as insecticidal, fungicidal activities (Wang et al., 1999).

The structure of the title compound, (I), is shown in Fig. 1, in which the bond lengths and angles are generally within normal ranges (Allen et al., 1987). The dihedral angle between the thiadiazole and benzene ring is 27.1 (2)°. There are intermolecular N—H···N and C—H···O hydrogen bonds, linking the molecules, forming chains along the b axis (Fig. 2),.

Related literature top

For general background to the biological activity of 1,3,4-thiadiazole derivatives, see: Nakagawa et al. (1996); Wang et al. (1999). For bond-length data, see: Allen et al. (1987).

Experimental top

2-Fluoro-4-nitrobenzoic acid (2 mmol) and thiosemicarbazide (5 mmol) were mixed in a 25 ml flask, and kept in the oil bath at 363 K for 6 h. After cooling, the crude product (I) precipitated and was filted. Pure compound (I) was obtained by crystallization from ethanol (20 ml). Crystals of (I) suitable for X-ray diffraction were obtained by slow evaporation of an acetone solution.

Refinement top

H atoms were placed geometrically with C—H = 0.93 Å and N—H = 0.86 Å, and included in the refinement in riding motion approximation with Uiso(H) = 1.2 or 1.5Ueq of the carrier atom.

Computing details top

Data collection: CAD-4 Software (Enraf–Nonius, 1989); cell refinement: CAD-4 Software (Enraf–Nonius, 1989); data reduction: XCAD4 (Harms & Wocadlo,1995); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008); molecular graphics: SHELXTL (Sheldrick, 2008); software used to prepare material for publication: SHELXL97 (Sheldrick, 2008).

Figures top
[Figure 1] Fig. 1. A view of the molecular structure of (I). Displacement ellipsoids are drawn at the 50% probability level.
[Figure 2] Fig. 2. Partial packing view showing the hydrogen-bonded network. Dashed lines indicate intermolecular N—H···N and C—H···O hydrogen bonds.
5-(2-Fluoro-4-nitrophenyl)-1,3,4-thiadiazol-2-amine top
Crystal data top
C8H5FN4O2SF000 = 488
Mr = 240.22Dx = 1.665 Mg m3
Monoclinic, P21/cMelting point: 476 K
Hall symbol: -P 2ybcMo Kα radiation
λ = 0.71073 Å
a = 9.1780 (18) ÅCell parameters from 25 reflections
b = 9.3720 (19) Åθ = 9–12º
c = 11.413 (2) ŵ = 0.34 mm1
β = 102.55 (3)ºT = 293 K
V = 958.2 (3) Å3Block, colourless
Z = 40.20 × 0.10 × 0.10 mm
Data collection top
Enraf–Nonius CAD-4
diffractometer
Rint = 0.047
Radiation source: fine-focus sealed tubeθmax = 25.2º
Monochromator: graphiteθmin = 2.3º
T = 293 Kh = 0→11
ω/2θ scansk = 0→11
Absorption correction: ψ scan
(North et al., 1968)
l = 13→13
Tmin = 0.935, Tmax = 0.9673 standard reflections
1832 measured reflections every 200 reflections
1720 independent reflections intensity decay: 1%
1301 reflections with I > 2σ(I)
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.056H-atom parameters constrained
wR(F2) = 0.194  w = 1/[σ2(Fo2) + (0.1P)2 + 2.P]
where P = (Fo2 + 2Fc2)/3
S = 1.01(Δ/σ)max < 0.001
1720 reflectionsΔρmax = 0.43 e Å3
145 parametersΔρmin = 0.47 e Å3
Primary atom site location: structure-invariant direct methodsExtinction correction: none
Crystal data top
C8H5FN4O2SV = 958.2 (3) Å3
Mr = 240.22Z = 4
Monoclinic, P21/cMo Kα
a = 9.1780 (18) ŵ = 0.34 mm1
b = 9.3720 (19) ÅT = 293 K
c = 11.413 (2) Å0.20 × 0.10 × 0.10 mm
β = 102.55 (3)º
Data collection top
Enraf–Nonius CAD-4
diffractometer
1301 reflections with I > 2σ(I)
Absorption correction: ψ scan
(North et al., 1968)
Rint = 0.047
Tmin = 0.935, Tmax = 0.9673 standard reflections
1832 measured reflections every 200 reflections
1720 independent reflections intensity decay: 1%
Refinement top
R[F2 > 2σ(F2)] = 0.056145 parameters
wR(F2) = 0.194H-atom parameters constrained
S = 1.01Δρmax = 0.43 e Å3
1720 reflectionsΔρmin = 0.47 e Å3
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
S0.65883 (14)0.15613 (12)0.66472 (10)0.0442 (4)
F0.6863 (3)0.1515 (3)0.6466 (2)0.0539 (8)
N10.9259 (5)0.4021 (5)0.3718 (4)0.0537 (11)
C10.8706 (5)0.2697 (4)0.4162 (4)0.0404 (10)
O11.0171 (6)0.3935 (5)0.3093 (4)0.0892 (15)
O20.8765 (4)0.5153 (4)0.4009 (4)0.0656 (11)
N20.6452 (5)0.2128 (4)0.4420 (3)0.0449 (9)
C20.8888 (5)0.1427 (5)0.3565 (4)0.0448 (11)
H2B0.93870.14150.29380.054*
N30.5854 (5)0.3311 (4)0.4867 (3)0.0475 (10)
C30.8298 (5)0.0180 (5)0.3938 (4)0.0412 (10)
H3B0.83860.06740.35440.049*
N40.5320 (5)0.4162 (4)0.6663 (3)0.0535 (11)
H4A0.49510.49430.63290.064*
H4B0.53470.40160.74120.064*
C40.7568 (5)0.0197 (4)0.4903 (4)0.0358 (10)
C50.7505 (5)0.1484 (5)0.5495 (4)0.0388 (10)
C60.8026 (5)0.2754 (5)0.5131 (4)0.0421 (10)
H6A0.79250.36090.55190.050*
C70.6885 (5)0.1134 (4)0.5224 (4)0.0367 (10)
C80.5851 (5)0.3175 (4)0.6019 (4)0.0378 (10)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
S0.0663 (8)0.0343 (6)0.0343 (6)0.0124 (5)0.0166 (5)0.0053 (4)
F0.0753 (19)0.0440 (16)0.0517 (16)0.0078 (13)0.0340 (14)0.0074 (12)
N10.069 (3)0.038 (2)0.054 (2)0.013 (2)0.012 (2)0.0076 (19)
C10.047 (2)0.031 (2)0.042 (2)0.0064 (19)0.0066 (19)0.0057 (19)
O10.125 (4)0.067 (3)0.096 (3)0.032 (3)0.068 (3)0.003 (2)
O20.075 (3)0.041 (2)0.075 (3)0.0038 (18)0.003 (2)0.0161 (19)
N20.068 (3)0.0328 (19)0.0379 (19)0.0120 (18)0.0200 (18)0.0030 (16)
C20.053 (3)0.040 (3)0.045 (2)0.006 (2)0.019 (2)0.005 (2)
N30.073 (3)0.0292 (19)0.045 (2)0.0150 (18)0.0237 (19)0.0044 (16)
C30.055 (3)0.032 (2)0.038 (2)0.0018 (19)0.014 (2)0.0020 (18)
N40.084 (3)0.040 (2)0.039 (2)0.020 (2)0.018 (2)0.0030 (17)
C40.040 (2)0.032 (2)0.034 (2)0.0034 (18)0.0068 (18)0.0020 (17)
C50.043 (2)0.037 (2)0.038 (2)0.0015 (19)0.0131 (18)0.0014 (18)
C60.056 (3)0.030 (2)0.041 (2)0.003 (2)0.012 (2)0.0016 (18)
C70.042 (2)0.031 (2)0.038 (2)0.0026 (18)0.0120 (19)0.0016 (18)
C80.048 (2)0.032 (2)0.035 (2)0.0058 (18)0.0101 (19)0.0053 (17)
Geometric parameters (Å, °) top
S—C81.746 (4)C2—H2B0.9300
S—C71.750 (4)N3—C81.321 (6)
F—C51.363 (5)C3—C41.409 (6)
N1—O11.214 (6)C3—H3B0.9300
N1—O21.227 (5)N4—C81.338 (6)
N1—C11.472 (6)N4—H4A0.8600
C1—C61.384 (6)N4—H4B0.8600
C1—C21.400 (6)C4—C51.389 (6)
N2—C71.308 (5)C4—C71.478 (6)
N2—N31.382 (5)C5—C61.381 (6)
C2—C31.392 (6)C6—H6A0.9300
C8—S—C786.65 (19)H4A—N4—H4B120.0
O1—N1—O2124.0 (4)C5—C4—C3117.9 (4)
O1—N1—C1118.6 (4)C5—C4—C7123.2 (4)
O2—N1—C1117.4 (4)C3—C4—C7118.9 (4)
C6—C1—C2123.0 (4)F—C5—C6117.7 (4)
C6—C1—N1119.4 (4)F—C5—C4119.0 (4)
C2—C1—N1117.6 (4)C6—C5—C4123.3 (4)
C7—N2—N3113.4 (3)C5—C6—C1116.9 (4)
C3—C2—C1118.0 (4)C5—C6—H6A121.5
C3—C2—H2B121.0C1—C6—H6A121.5
C1—C2—H2B121.0N2—C7—C4120.6 (4)
C8—N3—N2112.1 (3)N2—C7—S113.8 (3)
C2—C3—C4120.8 (4)C4—C7—S125.7 (3)
C2—C3—H3B119.6N3—C8—N4124.0 (4)
C4—C3—H3B119.6N3—C8—S114.1 (3)
C8—N4—H4A120.0N4—C8—S121.9 (3)
C8—N4—H4B120.0
O1—N1—C1—C6161.4 (5)C4—C5—C6—C13.3 (7)
O2—N1—C1—C618.5 (6)C2—C1—C6—C50.5 (7)
O1—N1—C1—C219.2 (7)N1—C1—C6—C5178.9 (4)
O2—N1—C1—C2161.0 (5)N3—N2—C7—C4179.2 (4)
C6—C1—C2—C32.8 (7)N3—N2—C7—S0.2 (5)
N1—C1—C2—C3176.7 (4)C5—C4—C7—N2153.1 (4)
C7—N2—N3—C80.0 (6)C3—C4—C7—N225.6 (6)
C1—C2—C3—C41.3 (7)C5—C4—C7—S27.5 (6)
C2—C3—C4—C52.2 (7)C3—C4—C7—S153.7 (4)
C2—C3—C4—C7176.6 (4)C8—S—C7—N20.2 (4)
C3—C4—C5—F177.2 (4)C8—S—C7—C4179.2 (4)
C7—C4—C5—F4.0 (7)N2—N3—C8—N4179.3 (4)
C3—C4—C5—C64.7 (7)N2—N3—C8—S0.2 (5)
C7—C4—C5—C6174.1 (4)C7—S—C8—N30.2 (4)
F—C5—C6—C1178.5 (4)C7—S—C8—N4179.4 (4)
Hydrogen-bond geometry (Å, °) top
D—H···AD—HH···AD···AD—H···A
N4—H4A···N3i0.862.163.000 (5)167
C3—H3B···O1ii0.932.543.182 (7)126
Symmetry codes: (i) −x+1, −y+1, −z+1; (ii) −x+2, y+1/2, −z+1/2.
Table 1
Hydrogen-bond geometry (Å, °)
top
D—H···AD—HH···AD···AD—H···A
N4—H4A···N3i0.862.163.000 (5)167
C3—H3B···O1ii0.932.543.182 (7)126
Symmetry codes: (i) −x+1, −y+1, −z+1; (ii) −x+2, y+1/2, −z+1/2.
Acknowledgements top

The authors thank Professor Hua-qin Wang of the Analysis Centre, Nanjing University, for providing the Enraf–Nonius CAD-4 diffractometer for this research project.

references
References top

Allen, F. H., Kennard, O., Watson, D. G., Brammer, L., Orpen, A. G. & Taylor, R. (1987). J. Chem. Soc. Perkin Trans. 2, pp. S1–19.

Enraf–Nonius (1989). CAD-4 Software. Enraf–Nonius, Delft, The Netherlands.

Harms, K. & Wocadlo, S. (1995). XCAD4. University of Marburg, Germany.

Nakagawa, Y., Nishimura, K., Izumi, K., Kinoshita, K., Kimura, T. & Kurihara, N. (1996). J. Pestic. Sci. 21, 195–201.

North, A. C. T., Phillips, D. C. & Mathews, F. S. (1968). Acta Cryst. A24, 351–359.

Sheldrick, G. M. (2008). Acta Cryst. A64, 112–122.

Wang, Y. G., Cao, L., Yan, J., Ye, W. F., Zhou, Q. C. & Lu, B. X. (1999). Chem. J. Chin. Univ. 20, 1903–1905.