Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 5| Part 3

ISSN: 1600-5767

June 1972 issue

research papers

X-ray topographic studies on the lattice distortions of single crystals of silicon due to scratching

M. Renninger

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Vergleichende Untersuchung über die röntgentopographischen Verfahren der Abbildung von Kristalldefekten

U. Wattenberg

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Adaption d'un ensemble de détection Si(Li) à un diffractometre X

J. P. Lauriat and P. Pério

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X-ray small-angle scattering of glassy carbon

R. Perret and W. Ruland

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The precision determination of the lattice parameters and the coefficients of thermal expansion of BiFeO₃

J. D. Bucci, B. K. Robertson and W. J. James

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The identification of twins from intensity statistics

E. Stanley

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Examination of the solid phases in the system AgI–NaI–H₂O

L. R. Johnson and B. L. Davis

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Further studies on the nickel–aluminium system. I. β-NiAl and δ-Ni₂Al₃ phase fields

A. Taylor and N. J. Doyle

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Further studies on the nickel–aluminum system. II. Vacancy filling in β and δ-phase alloys by compression at high temperatures

A. Taylor and N. J. Doyle

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Small-angle X-ray scattering study of glassy GeO₂

A. Pierre, D. R. Uhlmann and F. N. Molea

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The cell dimensions of W_1xTa_xSe₂

A. A. Al-Hilli and B. L. Evans

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The influence of preferred orientation on the line width and peak shift of (hk) interferences

W. Ruland and H. Tompa

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Langage algorithmique de mesure d'intensités

G. C. Bassi, J.-C. Guitel and M. Geynet

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A comparison of the fast Fourier and trigonometric Fourier algorithms

C. R. Hubbard, C. O. Quicksall and R. A. Jacobson

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short communications

The symmetry of the structure of the $\def\lambdabar{\ifvmode\noindent\fi{\hbox{$\lambda$}\kern-0.35em\raise0.7ex\hbox{-}\kern0.2em}}\lambdabar$ phase in Zr and Ti alloys

S. L. Sass and B. Borie

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The effect of multiple diffraction on the electron-microscope image

H. Lipson and S. G. Lipson

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Precise measurement of lattice parameters of single crystals in conjunction with a hot stage

M. A. G. Halliwell

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Zur Elementarzelle von Ca₃TeO₆

M. Trömel

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The definition of the indexing figure of merit M₂₀

P. M. de Wolff

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A technique for the preparation of metal samples for Debye–Scherrer cameras

B. J. Beaudry and O. D. McMasters

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Computer-generated transmission electron diffraction patterns

R. A. Ploc and G. H. Keech

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Etude radiocristallographique du bicarbonate de césium

C. Caranoni, R. Favier and L. Carbonnel

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crystal data

Crystal data on tin(II) phosphate chloride, Sn₂PO₄Cl

A. F. Berndt, J. M. Sylvester, T. H. Jordan and T. F. Spenader

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laboratory notes

A device for aligning a Weissenberg X-ray diffractometer to a monochromator

W. F. Cole and C. J. Lancucki

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A simple small-scale recrystallization apparatus

D. J. Watkin

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international union of crystallography

IUCr-UNESCO Project on the Teaching of Crystallography

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book reviews

Preparation and properties of solid state material. Vol. 1 edited by R. A. Lefever

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Physics of thin films. Volume 6 edited by M. H. Francome

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books received

X-ray Spectrometry - an International Journal edited by R. Jenkins

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Instrumental and radiochemical activation analysis by J. Hoste, J. Op. de Beeck, R. Gijbels, F. Adams, P. Van den Winkel and D. de Soete

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Handbook of electronic materials. Volume 5. Group IV semiconducting materials by M. Neuberger

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Advances in X-ray analysis edited by C. S. Barrett and C. Ruud

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international union of crystallography

Key to the Second Supplement to the Crystallographic Book List

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