Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

issue contents

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 15| Part 4

ISSN: 1600-5767

August 1982 issue

Highlighted illustration

lead articles

link to html

The Rietveld method in neutron and X-ray powder diffraction

A. Albinati and B. T. M. Willis

Read article

research papers

link to html

Precise lattice-constant determinations using measured beam and crystal tilts

Read article

link to html

The cation-atom distribution in a (Cr, Fe, Al, Mg)₃O₄ spinel as revealed from the channelling effect in electron-induced X-ray emission

Read article

link to html

A microprocessor-controlled continuous-flow cryostat for single-crystal X-ray diffraction in the range 10–300 K

S. Allen, J. Cosier, A. M. Glazer, T. J. Hastings, D. T. Smith and I. G. Wood

Read article

link to html

Noise level and resolution effects in EXAFS spectra

T. I. Morrison, G. K. Shenoy and D. Niarchos

Read article

link to html

Ultra-high vacuum heating camera for in situ synchrotron radiation X-ray topographic studies

J. Gastaldi, C. Jourdan, P. Marzo, C. Allasia and J. N. Jullien

Read article

link to html

On the topography of chemically etched (00 $\overline{1}$ ) surfaces of ZnO

Read article

link to html

Kinetic measurement of autoxidation in carotenoids by X-ray diffraction: a new, rapid, and reliable method

Read article

link to html

Specimen preparation of low-melting-point solidified gases for low-temperature powder diffractometry

Read article

link to html

The evaluation of crystal perfection by means of the asymmetric Bragg reflections

M. Wołcyrz and K. Łukaszewicz

Read article

link to html

A high-temperature deformation stage for X-ray synchrotron topography. Applications to dislocation mechanisms in silicon

A. George and G. Michot

Read article

link to html

Sur l'origine des canaux dans les cristaux

E. Scandale and A. Zarka

Read article

link to html

Determination of the strain concentration factors around holes and inclusions in crystals by X-ray topography

J. Chaudhuri, Z. H. Kalman, G. J. Weng and S. Weissmann

Read article

link to html

Profile shape functions in Rietveld refinements

R. A. Young and D. B. Wiles

Read article

link to html

Interactive computer display and analysis of small-molecule crystal structures

S. M. Swanson, R. E. Rosenfield Jnr and E. F. Meyer Jnr

Read article

link to html

Small-angle scattering at a pulsed neutron source: comparison with a steady-state reactor

C. S. Borso, J. M. Carpenter, F. S. Williamson, G. L. Holmblad, M. H. Mueller, J. Faber Jnr, J. E. Epperson and S. S. Danyluk

Read article

link to html

Addenda to the optimization of quantitative X-ray diffraction analysis

Read article

link to html

Structural ordering in amorphous TbFe₂ and YFe₂

P. D'Antonio, J. H. Konnert, J. J. Rhyne and C. R. Hubbard

Read article

short communications

link to html

Thermal expansion of α-HgI₂

S. Gauthier and I. F. Nicolau

Read article

crystal data

link to html

Etude de la solution solide (CH₃)₄N.Mn_1−xCu_xCl₃ (x=0–0,5)

A. Cheikh-Rouhou and A. Daoud

Read article

computer programs

link to html

Computer program for the derivation of symmetry operations from the space-group symbols

H. Burzlaff and A. Hountas

Read article

link to html

Interactive dynamic molecular display

C. L. Nix and B. Rubin

Read article

laboratory notes

link to html

A goniometer for large single crystals

Read article

crystallographers

link to html

Crystallographers

Read article

international union of crystallography

link to html

Bibliography of Mathematical Crystallography

Read article

book reviews

link to html

Nondestructive evaluation of materials edited by J. J. Burke and V. Weiss

Read article

Kudos

News and jobs

Meetings

Follow J. Appl. Cryst.

Sign up for e-alerts

Follow J. Appl. Cryst. on Twitter

Follow us on facebook

Sign up for RSS feeds