view article
Figure 1
Definitions of parameters for a single X-ray, emanating from a line source of length Lx with an incident-beam axial divergence β, which is diffracted through an angle 2θ. When the receiving slit is positioned at 2φ it registers a diffracted X-ray with the axial divergence γ.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 31| Part 6| December 1998| Pages 851-861
https://doi.org/10.1107/S0021889898006876
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS