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Figure 4
Powder diffraction pattern obtained by integrating the Debye–Scherrer ring of Fig. 3[link]. The cross marks are experimental points and the solid line is a Rietveld fit using the data from 18 to 120° in 2θ; the lower trace shows the difference between the observed and calculated intensities. Tick marks indicate the positions of allowed Bragg reflections. The inset shows the 111 reflection profile.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 33| Part 5| October 2000| Pages 1241-1245
doi:10.1107/S0021889800009286
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