addenda and errata\(\def\hfill{\hskip 5em}\def\hfil{\hskip 3em}\def\eqno#1{\hfil {#1}}\)

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767

A new version of the method for analysing peak broadening caused by local tilt distribution in double-crystal X-ray diffraction measurements. Erratum

aNTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243-0198, Japan
*Correspondence e-mail: nakashim@aecl.ntt.co.jp

As a result of a printer's error, Fig. 9[link] of the paper by Nakashima[Nakashima, K. (2000). J. Appl. Cryst. 33, 1376-1385.] [J. Appl. Cryst. (2000), 33, 1376–1385 ] was incorrectly printed. The correct figure[link] is given here.

[Figure 9]
Figure 9
Result of the new analysis method when applied to the minus-first-order satellite peaks in the φ = 270° profiles shown in Fig. 7. (a) Three different hkl profiles obtained after rescaling of the horizontal axis by cosθc. Each peak position is shifted to the origin. In other words, Δθ = θθ(reference peak) and θ(minus-first-order satellite peak) is adopted as the θ(reference peak). (b) The three profiles in (a) replotted by adjusting their peak intensity tops to that of 004 in order to examine more accurately whether the three profiles are the same or not. The background level for each hkl profile is also indicated in (a) and (b). Only the signals above the background levels are significant for the comparison.

References

First citationNakashima, K. (2000). J. Appl. Cryst. 33, 1376–1385. Web of Science CrossRef CAS IUCr Journals

© International Union of Crystallography. Prior permission is not required to reproduce short quotations, tables and figures from this article, provided the original authors and source are cited. For more information, click here.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds