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Figure 6
A Williamson–Hall plot constructed from the peak profiles of the synchrotron X-ray powder diffraction pattern collected at 298 K. The size parameter, 〈D〉v, obtained for the even–even–even reflections corresponds to the volume-weighted crystallite size, while the same parameter obtained from the odd–odd–odd reflections gives the average (volume-weighted) size of the Sc/Ta ordered domains. The dotted line corresponds to the best fit to the odd–odd–odd reflections if one constrains the strain to be the same for both sets of reflections; it gives an ordered domain size of 97 nm.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 35| Part 2| March 2002| Pages 233-242
doi:10.1107/S0021889802001280
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