view article

Figure 4
The scattering pattern obtained at 723 K showing the functions used for fitting the Guinier and Porod regions [dotted line: data; solid line: Guinier (A) and Porod (B) functions; dashed line: unified model fit].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds