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Figure 5
Scattered X-ray intensity for a magnesia screed (from Graz, Austria) at T = 295 K as a function of diffraction angle 2θ. Shown are the observed pattern (diamonds), the best Rietveld-fit profile for five phases (a), the difference curve between the observed and calculated profile (b), and the reflection markers (vertical bars). The intensity is plotted on a logarithmic scale. The wavelength was λ = 0.70041 (2) Å. The R values are Rp = 8.6%, Rwp = 11.0% and R(F2) = 26.9%.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 39| Part 5| September 2006| Pages 739-744
doi:10.1107/S0021889806032109
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