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Figure 1
(a) Schematic view of X-ray reflection for cases when the incident angle is lower and higher than the critical angle, θc. (b) Simulated XRR profile for a single layer system. The critical angle (determined by film density) and Kiessig fringes (determined by layer thickness) are observed.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 41| Part 1| January 2008| Pages 143-152
doi:10.1107/S0021889807051904
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