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Figure 12
Measured X-ray elastic strains [\{ \varepsilon _{33}^{\rm{L}} \} _\psi ^{hkl}] in Cu (a) and CrN (b) thin films as a function of the sample tilt angle ψ. Positive (a) and negative (b) slopes indicate tensile and compressive stresses in Cu and CrN, respectively. The strains were determined with a precision better than ±10%.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 42| Part 3| June 2009| Pages 416-428
https://doi.org/10.1107/S0021889809011807
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