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Figure 1
Portions of XRD raw diffractograms of samples (a) S1 (dashed lines) and S2 (solid line) and (b) S3. All peaks are indexed in a cubic crystal system. The intensities have been normalized against the (311) peak.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 43| Part 3| March 2010| Pages 394-400
doi:10.1107/S0021889810008150
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