view article
Figure 9
A TEM equivalent of 3DXRD. The three-dimensional grain-orientation map comprises a subvolume of the fully reconstructed volume within the 150 nm-thick aluminium film specimen. The colour scale represents different crystal orientations with a tolerance of 2°. The spatial resolution is estimated to be 1 nm. From Liu et al. (2011BB40).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 45| Part 6| December 2012| Pages 1084-1097
https://doi.org/10.1107/S0021889812039143
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS