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Figure 1
Schematic view of two-dimensional and three-dimensional X-ray microscopy. (a) White synchrotron X-rays are either passed to K–B mirrors with the monochromator removed or double-Bragg reflected as monochromatic X-rays to the K–B mirror. The focused microbeam strikes the sample and produces either a polychromatic Laue pattern on the detector or a single monochromatic Bragg reflection. (b) Same as (a), but with a Pt diffracted-beam profiler wire to provide spatial resolution in three dimensions. Adapted from Yang, Larson, Tischler et al. (2004BB71) with permission.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 1| December 2013| Pages 153-164
doi:10.1107/S0021889812043737
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