Figure 5
Comparison of scanned monochromatic 3DXM measurements and calculations of surface normal strain in a 25 µm-thick silicon plate bent elastically to a radius of 3 mm. The inset shows the sharply peaked Bragg intensity as a function of monochromator energy and depth along the microbeam in the bent plate. Adapted from Yang et al. (2003BB57) with permission.  [article HTML]

© International Union of Crystallography 2013