Contrast in transmission X-ray diffraction topographs of growth defects in the core of SrLaGaO4 single crystals

Malinowska, A.; Lefeld-Sosnowska, M.; Härtwig, J.

doi:10.1107/S0021889812050522

Figure 5
Dependence of the diffraction contrast on absorption for rod-like defects in SLG crystals. Transmission projection topographs of sample A [regions C and D marked in Fig. 1

(a)]. (a) Lang topograph; (b)-(d) synchrotron white-beam topographs. I₁₍₂₎ is the intensity of the type 1 (2) wavefield, I₀ is the initial value of intensity; I₁₍₂₎ = I₀exp[- [mu]

₁₍₂₎t], where t is the thickness of the sample.