Resonant X-ray scattering studies of epitaxial complex oxide thin films

Perret, E.; Park, C.; Fong, D.D.; Chang, K.-C.; Ingram, B.J.; Eastman, J.A.; Baldo, P.M.; Fuoss, P.H.

doi:10.1107/S0021889812047620

Figure 8
Results of fitting measured data at 973 K and pO₂ = 150 Torr. (a) Combined fits (solid lines) of measured (open diamonds and dashed lines) non-resonant and resonant CTRs. Only the data points used for fitting are shown. Low-intensity regions and Bragg-peak regions have been omitted. Curves are offset for clarity. The minimized $[\chi^2_{\rm meas}]$ error is indicated. (b) Computed CTRs from RAXR results (solid lines) and measured non-resonant and resonant CTRs (dashed lines). Circles indicate the L_i positions where intensities I_meas(L_i, E_NR, E_R) were fitted. (c) Determined electron-density profiles from fits of RAXR data (solid line; Fig. 7

) and combined fits (dotted line; Fig. 8a