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Figure 1
Theoretical symmetric back-diffraction profiles for α-SiO2 (quartz) showing high reflectivities even at lower energies. (a) α-SiO2 [\overline 2110] (X-cut) at 2.5 keV, (b) α-SiO2 [\overline 4220] (X-cut) at 5.05 keV, (c) α-SiO2 [\overline 6330] (X-cut) at 7.57 keV, (d) α-SiO2 [\overline 8440] (X-cut) at 10.09 keV, (e) α-SiO2 [{\overline {10}}\,5\,5\,0] (X-cut) at 12.6 keV and (f) α-SiO2 [\overline 743\overline 4] at 9.978 keV.

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