Figure 7
Proposed multi-energy inelastic X-ray scattering spectrometer based on different diffraction orders of the [alpha]-SiO2 X-cut monochromator and spherical analyzer. The multi-bounce [alpha]-SiO2 X-cut monochromator is set, in an oven, downstream of an Si 111 cryo-cooling pre-monochromator. The energy scan, based on the inverse geometry, is taken by changing the temperature of the [alpha]-SiO2 X-cut monochromator. A spherical analyzer, or a set of them, and a position-sensitive detector complete the setup.  [article HTML]