Figure 6
Comparison of reciprocal space maps of samples: (a) Si islands only, (b) after direct Ge deposition, (c) after Ge deposition on an Si0.4Ge0.6 buffer layer and (d) after Ge deposition on an Si0.7Ge0.3 buffer layer in the as-deposited state measured at [alpha]i = 0.12°.  [article HTML]