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![[Figure 2]](xz5008fig2mag.jpg)
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Figure 2
Comparison between the SEM image along a row of NWs (a) and a real space map (b) along a similar row under the diffraction condition for the GaAs symmetric 111 reflection. The diffraction signals of a triangular and a number-shaped marker (hard to identify in the RSM) are clearly visible. In the space between the markers, a few nanowires having the expected spacing of 5 µm can be distinguished. The positions of the NWs are marked with red circles. |
![[Figure 2]](xz5008fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
