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Figure 7
Cross-section TEM images from the constant-composition samples. (a) SiGe-a; (b) SiGe-b; (c) SiGe-c.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 912-918
doi:10.1107/S0021889813011308
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