Development of a simultaneous measurement system for SAXS–WAXD and the thickness of coating films during film formation by solvent evaporation

Shimokita, K.; Miyazaki, T.; Ogawa, H.; Yamamoto, K.

doi:10.1107/S1600576713031774

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
(a) The home-made automatic coater equipped on the height stage of BL03XU at SPring-8. A film thickness gauge and an automatic syringe pump are also set up. (b) An illustration of the simultaneous measurement system of SAXS–WAXD and film thickness.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 47| Part 1| February 2014| Pages 476-481

doi:10.1107/S1600576713031774

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