view article
Figure 3
Selected area electron diffraction pattern of the hk0 layer of PD2. The rings of very strong reflections far from the centre of the diffraction pattern are at 2.3 Å (inner) and 2.0 Å resolution (outer reflections, marked by a circle). This electron diffraction pattern was collected on a JEOL JEM-2000FX microscope.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 1| February 2014| Pages 215-221
doi:10.1107/S1600576713029294
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS