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Figure 10
∊–sin2Ψ plots of the Ni–Kapton film for φ = 90°, showing the measured lattice strains and the ones fitted by the XSF method, demonstrating a good fit.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 1| February 2014| Pages 291-302
doi:10.1107/S1600576713030756
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