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Figure 4
Reciprocal-space maps of a PZT 52/48 film on an SRO/STO substrate, with diffraction intensities shown in logarithmic scale as indicated on the scale bar. The data were collected at the SSLS, X-ray wavelength λ = 1.5405 Å. (a) (002) HL mapping, (b) (002) HK mapping with L = 1.901, (c) ([\overline 1]03) HL mapping and (d) (013) KL mapping. The SRO film has the same in-plane lattice parameters as the substrate, so that its spots nearly coincide with the STO spots in the mappings; separation of the SRO and STO features is beyond the scope of this article and is not considered further here. The PZT film shows a single spot in every mapping, with no sign of twinning. Note that a and b were chosen differently in the experiments at the SSLS and the SSRF, but the results are consistent.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 1| February 2014| Pages 402-413
doi:10.1107/S1600576713031191
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