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Figure 6
Synchrotron XRenS with the 008 primary reflection in NSH and NSH:Mg samples. Indexes h k l/h k 8-l stand for coinciding MDs.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 1| February 2014| Pages 160-165
doi:10.1107/S1600576713028677
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