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Figure 11
A schematic diagram in reciprocal space indicating isointensity contours of the same magnitude for the X (parallel-cut sample) measurement (circular contour, shown in orange) and for the Y (perpendicular-cut sample with the bedding plane horizontal) measurement (elliptical contour, shown in blue). The contours are tangential at the point (Q′, 0). The path of the slit-smearing integral at constant Q is shown in green and extends to ±Qm, corresponding to the maximum vertical divergence of the incident beam. The intensity at (Q, q) is greater for the Y measurement than for the X measurement for all Q, as is the integral given by equation (8)[link].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 3| June 2016| Pages 934-943
doi:10.1107/S1600576716005586
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