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Figure 7
(a) Data (black crosses) and best simulation (red solid line) of the 001 reflection from, from top to bottom, CSH 1.4–323 K, CSH 1.0–323 K, CSH 0.83–443 K, CSH 0.83–353 K, CSH 0.83–323 K and CSH 0.83–RT XRD patterns. The deduced evolution of the layer-to-layer distance as a function of sample Ca/Si ratio is shown in (b). All simulation results are given in Table 3[link].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 3| June 2016| Pages 771-783
doi:10.1107/S1600576716003885
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