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Figure 15
Multi-element detector reading (plus symbols) versus fit (solid line) using ξ (`Pol rot'), S (`Scale') and M (`MinMaj'). (a) Central glitch at 8621.4 eV, (b) top of glitch B1 at 8555.4 eV, (c) bottom of glitch B1 at 8556.6 eV, (d) center of glitch D at 8590.8 eV. The configuration of the pixels is shown in Fig. 2[link]. See Fig. 8[link] for labeling of the glitches.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 4| August 2016| Pages 1209-1222
doi:10.1107/S1600576716009183
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