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Figure 5
(a) Schematic of the model used for the description of nanoparticle shape. (b), (c) Intensity profiles of the GISAXS map shown in the inset of panel (b) taken along the lines indicated by P1 and P2, together with the intensity profiles of the simulated map obtained by a fit using the core/shell structure of nanohillocks shown in panel (a). (d), (e) Intensity profiles of the GISAXS map shown in the inset of panel (b) taken along the lines indicated by P1 and P2, together with the intensity profiles of the simulated map obtained by a fit using the full-ellipsoid structure of nanohillocks.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 5| October 2016| Pages 1704-1712
https://doi.org/10.1107/S1600576716013704
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