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Figure 1
(a) A Laue diffraction image from a single SNS Anger camera recorded on the MaNDi instrument using all wavelengths between 2 and 4.16 Å. (b) A diffraction pattern from the same detector, this time looking only at neutrons between 3.0 and 3.1 Å. As can be seen, the time of flight or wavelength resolution significantly reduces reflection overlap, enabling data collection from large unit-cell axes while also significantly lowering background and increasing the signal-to-noise ratio.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 4| August 2017| Pages 1174-1178
https://doi.org/10.1107/S1600576717010032
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